X-Ray Analysis of Residual Stresses in Ceramics.
نویسندگان
چکیده
منابع مشابه
Anisotropic residual stresses in partially crystallized Li2O±2SiO2 glass-ceramics
Levels of residual stresses in partially crystallized Li2O±2SiO2 glass-ceramics were calculated for several crystallographic planes. The stresses were also determined by an X-ray diraction method (XRD) using synchrotron radiation. The linear thermal expansion coecient (ahkl) of a fully crystallized, stress-free, powdered sample, was measured in situ using a hot-stage XRD technique. The therma...
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ژورنال
عنوان ژورنال: Journal of the Society of Materials Science, Japan
سال: 1999
ISSN: 1880-7488,0514-5163
DOI: 10.2472/jsms.48.1147